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This research guide highlights resources available through the Loyola University Chicago Libraries for Engineering Science research. Links to the most frequently used databases are found below; a more complete list of relevant databases is found under the Databases tab at the top of this guide.
Bibliographic information, abstracts, reviews, and the full-text for articles published in ACM periodicals and proceedings since its founding in 1947 are available in the library together with selected works published by affiliated organizations.
The IEEE Xplore Digital Library is a research database for electrical engineering, electronics, computer science and related disciplines. IEEE Xplore includes access to over 3.5 million full-text documents, including IEEE journals, magazines, conferences, standards, as well as IET journals, magazines, and conferences with a backfile to the late 1800s for select titles.
Safari Tech Books Online is a ready-reference resource covering certification, enterprise computing, Java, Linux/Unix, Web development, Windows, XML, and more technologies. ** NOTE:PATRONS WILL NEED TO CLICK "Not Listed" (in drop down of Select your Institution) TO CREATE THEIR SAFARI ACCOUNTS. Safari is currently working on streamlining the log in page and improving the process. You will need to use your LUC email address to create an account.
** NOTE:PATRONS WILL NEED TO CLICK "Not Listed" (in drop down of Select your Institution) TO CREATE THEIR SAFARI ACCOUNTS. Safari is currently working on streamlining the log in page and improving the process. You will need to use your LUC email address to create an account.
Scopus is a large abstract and citation database of peer-reviewed literature: scientific journals, books and conference proceedings. It contains resources in the fields of science, technology, medicine, social sciences, and arts and humanities.
A suite of citation databases including Science Citation Index, Social Sciences Citation Index, and Arts & Humanities Citation Index. You can also access Medline and Journal Citation Reports from this interface.